Electron Microscopy

Scanning Electron Microscope SU3500

Innovative electron source and detectors give superior imaging and analytical performance. Hex bias technology delivers high brightness at low accelerating voltages and the ultra variable-pressure detector is optimized for imaging surface at any pressure. The SU3500 is sure to be the workhorse in any laboratory.

Overview

The SU3500 Scanning Electron Microscope features innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance. Designed with intuitive logic, the new user-friendly GUI provides comprehensive image observation and display functions. Engineered for a wide range of applications, including biological specimens and advanced materials, the SU3500 is sure to be the workhorse microscope in any laboratory.

• Unparalleled Image Quality
  All new electron optics design with best-in-class image sharpness. 7 nm   SE Image Resolution at 3 kV, 10 nm BSE Image resolution at 5 kV.

• Intuitive Operation
  Wide-screen GUI and fast auto image optimization functions (7 seconds)   via "delegation" technology

• Ultra Variable Pressure Detector
  Image surface information at low vacuum and low   accelerating voltages

• Stereoscopic Image Function
  Point and click for seamless, real-time "3D" image observation

     


The electron optics design yields unmatched imaging performance achieving high resolution at low accelerating voltage.
     

Accelerating Voltage : 3 kV Secondary Electron (SE) Image Magnification : 40,000x Resolution : 7 nm

Accelerating Voltage : 5 kV Backscattered Electron (BSE) Image Magnification : 30,000x Resolution : 10 nm

Unique live signals can be mixed and displayed as a combined live image.


Features

Fast Auto Imaging
"Best-in-class" Auto Start Functions (Focus, Brightness, Contrast, and Stigmation) for unmatched ease of operation and efficiency.

Low kV and Low Vacuum Performance
The Hitachi "Hex-Bias" probe current optimization technology combined with the all new Ultra Variable-Pressure (UVD) detector offers superior imaging and surface information at low accelerating voltages and low vacuum conditions.

     

Sample: Vinca (Periwinkle) Vacc: 3.0kV,   Mag: 190x Pressure: 60Pa Signal: Ultra Variable-Pressure Detector                (UVD)

Sample: Thread sealing tape (extended) Vacc: 1.5kV,   Mag: 350x Pressure: 20Pa Signal: Ultra Variable-Pressure Detector                 (UVD), Without metal coating

Live Stereoscopic Imaging
Our advanced tilted-beam-scan technology enables point and click, real-time "3D" image observation (show 3D pictures from flyer).
    

Sample: Crustacea Vacc: 15kV,   Mag: 100x Signal: Backscattered Electron (BSE)

Sample: Brass Fracture Vacc: 15kV,    Mag: 5000x Signal: Secondary Electron (SE)

    

Sample: Textile Accelerating Voltage: 5kV Vacc: 50Pa,   Mag: 100x Signal: Ultra Variable-Pressure Detector             (UVD)

Sample: Rat intestine (Replica) Accelerating Voltage: 5 kV,    Mag: 350x Signal: Secondary Electron (SE) Sample courtesy : Ms. Noriko Nemoto, Bio-                             imaging Center, Kitasato                              University