Tabletop Microscope TM3030Plus
The TM3030Plus has a premium SE detector which has been incorporated in FE-SEM & VP-SEM and well-accepted by users as a high-sensitivity detector. It operates effectively under the low-vacuum environment and allows for quick SE image observation without specimen preparation.
The Hitachi TM3030Plus Tabletop SEM is equipped with a proprietary, highly sensitive low-vacuum secondary electron detector capable of revealing fine sample surface detail information. In low-vacuum mode, the TM3030Plus offers both secondary electron images and reflective electron images without any prior sample processing. The result is increased throughput and sample information to meet the growing demands of today's complex microscopy applications.
Overview
• Secondary electron imaging and reflective electron imaging under low- vacuum conditions.
• Composite imaging combining secondary electron and reflective electron data.
• Powerful auto-functions for user-friendly, simple operation.
• Low-vacuum observation without advance sample preparation.
• Hitachi optimized electron optics for unmatched imaging performance.
• Point-and-Click image optimization (accelerating voltage and vacuum intensity).
• Comprehensive optional accessory items.
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Key Features
Innovated Secondary Electron Detector
The TM3030Plus employs a premium secondary electron (SE) detector, which is typically used in FE-SEM or VP-SEM as a high-sensitivity detector. The SE detector affords quick SE image observation without specimen preparation, even in low-vacuum environment.
Unique Compositional Image
The TM3030Plus provides effective image analysis with dual signals in one image; combined SE signal for surface rich information and BSE signal for compositional information.
High Throughput EDX (optional) and Seamless Operation
The Energy Dispersive X-ray Spectrometer (EDX) for the Hitachi TM3030 series is equipped with the latest silicon drift detector (SDD), a large detection area (30 mm2), and multiple elemental analyses such as point/area analysis, line scan, and mapping. Uncoated sample observation brings seamless operation for the two signals through element mapping.
Specifications
| Magnification | 5x ~ 30,000x or up to 120,000x with digital zoom |
|---|---|
| Accelerating Voltage | 5kV, 15kV |
| OBSERVATION MODE |
BSE:Conductor/Standard/Charge-up
Reduction SE:Standard/Charge-up Reduction Mix:Standard/Charge-up Reduction |
| SIGNAL SELECTION | BSE/SE/Mix |
| Sample Size: | Up to 70mm in diameter and 50mm thickness |
| Stage Movement | X = 35mm; Y = 35mm |
| ELECTRON GUN | Pre-centered cartridge filament |
| AUTOMATIC FUNCTIONS | Auto start, Auto focus, Auto brightness/contrast |
| Dimensions | Main unit:
330 x 606 x 565 mm (manual
stage) 330 x 633 x 565 (motor drive stage) Diaphragm pump: 145 x 256 x 217 mm |
| Weight | Main unit:
65 kg (manual stage) 68 kg (motor drive stage) Diaphragm pump: 4.5 kg |
Tabletop Microscope TM3030Plus