The Hikari XP EBSD camera comes standard with an integrated forward scatter
detector (FSD) and DigiView IV can be upgraded with an FSD for characterizing
material and mineral microstructures in the SEM.
• Adjustable detector insertion provides multiple imaging
• Unique imaging capability for your EDAX EBSD system
• Orientation contrast
• Topographical contrast
• Compositional contrast
• Quality display of deformation and strain gradients
• Enhanced imaging functionality within OIM™ software
FSD image illustrating orientation and
compositional contrast of quartzenstatite sample
courtesy of Dr. Karsten Kunze, Geologisches Institut, Zurich, Switzerland.