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          • Tabletop Microscopes TM4000II/TM4000PlusII
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          • TM Series Energy Dispersive X-ray Spectrometer: Quantax75
          • TM Series Energy Dispersive X-ray Spectrometer: Element Series
          • TM Series Energy Dispersive X-Ray Spectrometers: AZtec Series
          • The TM Series 3D visualization software Hitachi map 3D
        • Variable Pressure Scanning Electron Microscope (VP-SEM)
          • Scanning Electron Microscopes SU3800/SU3900
          • Scanning Electron Microscope SU3500
          • Scanning Electron Microscope S-3700N
          • Scanning Electron Microscope FlexSEM 1000 / FlexSEM 1000 II
        • Field Emission Scanning Electron Microscope (FESEM)
          • Ultra-high Resolution Field Emission Scanning Electron Microscope SU9000
          • Ultra-high Resolution Field Emission Scanning Electron Microscope Rugulus Series
          • Ultra-High-Resolution Schottky Field Emission Scanning Electron Microscope SU7000
          • Schottky Field Emission Scanning Electron Microscope SU5000
        • Transmission Electron Microscope (TEM)
          • Field Emission Transmission Electron Microscope HF5000
          • Field Emission Transmission Electron Microscope HF-3300
          • Transmission Electron Microscope H-9500
          • Transmission Electron Microscope HT7800 Series
        • Transmission Electron Microscope (STEM)
          • Field Emission Scanning Transmission Electron Microscope HD-2700 with and without spherical aberration corrector
      • MicroCT
        • Specimen Systems
          • µCT 35
          • µCT 40
          • µCT 45
          • µCT 50 (nano CT)
          • µCT 90
          • µCT 100
          • µCT 100 HE
        • Preclinical Systems
          • vivaCT 40 - In vivo MicroCT
          • vivaCT 75 - In vivo MicroCT
          • vivaCT 80 - In vivo MicroCT
          • XtremeCT II
          • XtremeCT
        • Clinical microCT
          • XtremeCT II
      • Scanning Acoustic Microscopy
        • KSI v-Series
          • KSI v 300
          • KSI v8
          • KSI v8 Advanced
          • KSI v8 Duo
          • KSI v8 Multihead
    • Focused Ion Beam
      • Focused Ion and Electron Beam System Ethos NX5000
      • Real-time 3D analytical FIB-SEM NX9000
      • Focused Ion and Electron Beam System & Triple Beam System NX2000
      • Focused Ion Beam System MI4050
      • Mirco-sampling system
      • CAD Navigation System
        NASFA (Navigation
        system for Failure
        Analysis)
    • Atomic Force Microscopy
      • Probe Station AFM5000II / Real TuneII
      • General-purpose Small Unit AFM5100N
      • Environment Control Unit AFM5300E
      • Atomic Force Microscope AFM5500M
    • Microanalysis
      • Energy Dispersive Microanalysis System (EDS)
        • TEAM™ EDS System for SEM
        • TEAM™ EDS System for TEM
        • Genesis System
        • EDS Detectors
          • Silicon Drift Detector (SDD) for the Transmission Electron Microscope (TEM)
          • Silicon Drift Detector (SDD) for the Scanning Electron Microscope (SEM)
          • Si(Li) Detector
      • Wavelength Dispersive Microanalysis System (WDS)
        • LEXS
        • TEXS
      • Electron Backscattered Diffraction (EBSD)
        • TEAM™ EBSD Analysis System
        • OIM™ Data Analysis
        • EBSD Cameras
          • Hikari XP EBSD Camera
          • DigiView IV EBSD Camera
          • Forward Scatter Detector (FSD)
    • nano-IR Spectroscopy
      • mIRage IR microscope
      • O-PTIR
    • Surface Metrology
      • Measuring Microscopes
        • Portable Measuring Microscopes
        • Video Measuring Microscopes
        • Measuring Microscopes with eyepiece
      • Microhardness Tester VMHT
    • Surface Sciences
      • LEIS
      • VLS-80
      • SurfaceLab 7
      • SIMS
        • M6
        • M6 Plus
        • M6 Hybrid SIMS
        • TOF-SIMS 5
      • X-ray Photoelectron Spectrometer (XPS)
        • K-Alpha™+ X-ray Photoelectron Spectrometer (XPS) System
        • ESCALAB 250Xi X-ray Photoelectron Spectrometer (XPS) Microprobe
        • Theta Probe Angle-Resolved X-ray Photoelectron Spectrometer (ARXPS) System
    • Raman Spectroscopy
      • XploRA Series
        • XploRA ONE™ - Simply better Raman
        • XploRA™ PLUS
        • XploRA INV
        • XP Examina - Forensics Package
      • LabRAM HR Evolution
      • Triple Raman spectrometers
    • Sample Preparations
      • Ultramicrotomes
        • PowerTome 3D
        • PowerTome PCZ
        • PowerTome XL
        • PowerTome FL
        • LN Ultra
        • Advanced Substrate Holder
        • Automated Tape Collecting Ultramicrotome
      • Rotary Microtomes
        • MT990: Rotary Microtome
        • MT990 with CR1000: Rotary Microtome with Cryosectioning System
        • MR3: Series 300 Motorized Rotary Microtome
        • MR2: Series 200 Manual Rotary Microtome
      • Workflow Instruments
        • Automated EM Tissue Processor
        • Anti-Vibration Table
        • FS8500: Freeze Substitution System
        • GKM2: Glass Knife Maker
      • Sputter Coaters and SEM/ TEM Carbon Coaters
        • SC7620 Mini Sputter Coater/Glow Discharge System
        • Q150V Plus for ultra-fine coatings in high vacuum applications
        • Q150R Plus - Rotary Pumped Coater
        • Q150T Plus - Turbomolecular pumped coater
        • Q150 GB Turbo-Pumped Sputter Coater / Carbon Coater for Glove Box
        • Q300T T Plus - triple target sputter coater for specimens up to 200mm diameter
        • Q300T D Plus - dual target sequential sputtering for specimens up to 150 mm diameter
      • Cryo-SEM Preparation Systems
        • PP3010T Cryo-SEM/Cryo-FIB/SEM Preparation System
        • PP3006 CoolLok Cryo Transfer for SEM and FIB/SEM
        • PP3005 SEMCool Non-Airlock Cooling System for SEM and FIB/SEM
      • Critical Point Dryers
        • E3100 Critical Point Dryer
        • K850 Critical Point Dryer
        • K850WM Large Chamber Critical Point Dryer
      • Freeze Dryers for Sample Preparation
        • K750X Peltier-Cooled EM Freeze Dryer
        • K775X Liquid Nitrogen Cooled Turbo-Pumped EM Freeze Dryer
      • Bench-Top Vacuum Evaporators
        • K975X/K975S Turbo-Pumped Thermal Evaporators
      • Recirculating Heaters and Chillers
        • E4800 Recirculating Heater/Chillers
      • Coolstage - Peltier-Cooled SEM Stage
      • K1050X RF Plasma Etcher/Asher/Cleaner
      • PP3004 QuickLok Ambient Transfer System
      • GloQube Glow Discharge System for TEM Grids and Surface Modifications
      • Sputter Targets
      • Carbon Consumables
      • IM4000Plus Series Ion-Milling Systems
      • ZONE Desktop Sample Cleaner and Desiccator for SEM/TEM
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Energy Dispersive Microanalysis System

TEAM™ EBSD - the Ease of TEAM™ with the Power of OIM™

TEAM™ EDS System for Scanning Electron Microscope (SEM) is offered with Apollo X Silicon Drift Detector (SDD) Series for a wide range of applications. The TEAM™ EDS System coupled with Smart Features is the most intuitive and easy to use analytical tool available for the SEM. The workflow functions are automated by integrating years of EDAX knowledge and expertise to work for you. Startup, Analysis, and Reporting are easy because the TEAM™ EDS automates each task. It’s the only EDS technology that combines smart decision making and guidance for the novice with advanced features for the experienced user. Now you have the intelligence of an EDS expert every step of the way.

Smart features, exceptional results

TEAM™ EDS for SEM was designed to save time and ensure accurate, reproducible results for a wide range of applications. Whether simply collecting a spectrum or performing complex phase analysis, the system and its touch screen capability make it easy to quickly get the results you want. TEAM™ EDS is built with a modern interface optimized for running in multicore and multiprocessor environments. Our TEAM™ EDS offers Smart Features for startup, analysis, and reporting not found in any other system. The core components that make up this functionality include:

Startup
Smart Track’s environmental panel monitors system status; reports operating conditions for the detector, stage, column, and more; plus allows access to advanced controls. Smart Acquisition automates routine tasks for ease of use and times savings.

Analysis
Smart Phase Mapping provides a higher level of analysis by automatically collecting spectra and generating phase maps with elemental distribution and associated spectra. Point analysis and line scan with next-generation EXpert ID enable fast and easy measurement of individual and multiple points from selected areas.

Reporting
Smart Data Review provides an innovative layout and project tree for quick review and reporting of images, maps, and spectra. Dynamic data editing is available in reports.



 

Smart Phase Mapping allows users to interactively work with dataset during collection.

Energy Dispersive Microanalysis System (EDS)

• TEAM™ EDS System for   SEM

• TEAM™ EDS System for   TEM

• Genesis System

• EDS Detectors
  - Silicon Drift Detector
    (SDD) for the
    Transmission Electron
    Microscope (TEM)
  
- Silicon Drift Detector
    (SDD) for the Scanning
    Electron Microscope
    (SEM)
  
- Si(Li) Detector

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