XP Examina

The XploRA Examina™ is the highly versatile, yet easy to use Raman microscope targeted at the Forensic analytical sector. It combines optical microscopy, with sensitive Raman analysis in a “ONE shot “analysis concept. Raman has never been so easy and yet so powerful in the Forensic Lab.

The XploRA Examina™ offers simplicity in design and operation so that the Forensic analyst can focus on the sample measurements and routine analysis that is important, obtaining results not just spectra.

It provides class leading sensitivity and confocal detail, full optical microscopy yet requires only minimal operator training and maintenance. With HORIBA’s innovative SWIFT™ Raman chemical imaging system and KIA database as standard the Examina™ is ideally matched to the needs of the busy Forensic Laboratory. The XploRA Examina™ philosophy ensures that Raman has become an even more accessible analytical technique for the Forensic analyst.

Features

The XploRA Examina™ is available in 2 options; the XploRA Examina One™ and the XploRA Examina Plus™, these systems are based on the renown and extremely well tested XploRA ONE and XploRA Plus™ Raman Microscope systems but they have been configured to perfectly match the requirements of Forensic examinations. The XploRA Raman Microscopes have an excellent reputation as highly versatile Raman microscope that combine ease of use with functionality and performance for the analytical lab.

The main features of the two systems are:

    XploRA Examina One™Open
    - Based on the XploRA ONE Raman Microscope system
    - 10x Faster Raman SWIFT™ Imaging
    - Large Area homogeneity analysis
    - Motorised X Y and Z stage , <1µm XY
    - Confocal optics, fixed for thin layer and particle analysis
    - Routine QC automation, One Click Raman Acquisitions, Custom       Methods and KIA database
    - Full optical research Grade Microscope; Illumination by       reflection/transmitted light, Polarisation and digital image capture with       Fluorescence Microscopy capabilities
    - 785nm Laser Single “one-shot” data acquisition for the full Raman range
    - Class (1) Safety Frame
    - Customised configurations and options available.
    - Automated FLAT fluorescence rejection
    - Patented Standard PRO calibration tool - Focus Free
    - Multi-laser options automated with PC control
    - Remote fibre-optic probes - for sampling hazardous materials in fume       cupboards/glove boxes available
    - HORIBA quality training and applications support programmes
    - Particle finder, an automated sample finder and analysis tool

    XploRA Examina Plus™Open
    - Based on the XploRA Plus Raman Microscope system
    - 10x Faster Raman SWIFT™ Imaging
    - Large Area homogeneity analysis
    - Motorised X Y and Z stage , <500nm XY resolution
    - Confocal optics, fixed for thin layer and particle analysis with multi       confocal settings
    - Routine QC automation, One Click Raman Acquisitions, Custom       Methods and KIA database
    - Multi laser automation for 3 lasers and 4 gratings for high resolution
    - Full Optical research Grade Microscope; Illumination by       reflection/transmitted light, Polarisation and digital image capture., with       Fluorescence Microscopy capabilities Autoswitch function and Trinoc       with eyepieces
    - 532nm, 638nm and 785nm Lasers and high resolution Raman mode.
    - Class (1) Safety Frame
    - Customised configurations and options available
    - Automated FLAT fluorescence rejection
    - Patented Standard PRO calibration tool - Focus Free
    - Multi-laser options automated with PC control
    - Remote fibre-optic probes - for sampling hazardous materials in fume       cupboards/glove boxes available
    - HORIBA quality training and applications support programmes
    - Particle finder, an automated sample finder and analysis tool

Raman in Forensic

Raman is an ideal technique for Forensic science offering high quality data, reliability and significant speed advantages over other analytical techniques. Benefits for the analysis of trace samples not only include the range of samples that can be analysed but also in the non-destructive nature of the analysis. Raman microscopy enables easier comparative analysis, unknown chemical identification and improved value for money.

The full confocal sensitivity of the XploRA Examina™ enables sub-micron scale particles to be isolated from the background and analysed, whilst HORIBA's unique SWIFT Fast Raman imaging enables sample regions of interest to be spectroscopically located and analysed. Minimal sample preparation and ease of in-situ analysis is ideal for the measurement of unknown and potentially hazardous samples

With more than 5000 samples in the optional spectral databases and additional commercial databases available, Raman identification becomes easy and reliable. An advanced Mixture analysis module can cope with complex mixture of powders and liquid samples, whilst functional group analysis can help identify important “chemical markers”.

    Benefits of Raman XploRA Examina™Open
    - Non-destructive testing and analysis
    - No sample preparation
    - Ideal for chemical analysis and identification
    - HORIBA OneClick Raman: simple operator level use
    - User login accounts for system security
    - Spectral databases – for simple interpretation of results
    - Automate you Raman analysis– with user defined measurement       methods
    - Auto-calibration and validation software– ensures your data is always       accurate
    - Automated particle location and chemical ID with ParticleFinder
    - Automated FLAT fluorescence rejection
    - Patented Standard PRO calibration tool - Focus Free
    - Multi-laser options automated with PC control
    - Remote fibre-optic probes - for sampling hazardous materials in fume       cupboards/glove boxes available
    - HORIBA quality training and applications support programmes
    Validation
    - NIST traceable calibration standards and Standard “SOP”’s
    - Patented autocalibration (focus free, ASTM, NIST traceable) ensures       data is always correctly validated and its precision assured
    - CFR 21 electronic records optional module provides data logging and       authenticity