logo

 
  • Home
  • Laboratory
  • Products ▼
    • Advanced Microscopy
      • Electron Microscopy
        • TableTop Microscope
          • Tabletop Microscopes TM4000II/TM4000PlusII
          • Tabletop Microscopes TM4000/TM4000Plus
          • TM Series Energy Dispersive X-ray Spectrometer: Quantax75
          • TM Series Energy Dispersive X-ray Spectrometer: Element Series
          • TM Series Energy Dispersive X-Ray Spectrometers: AZtec Series
          • The TM Series 3D visualization software Hitachi map 3D
        • Variable Pressure Scanning Electron Microscope (VP-SEM)
          • Scanning Electron Microscopes SU3800/SU3900
          • Scanning Electron Microscope SU3500
          • Scanning Electron Microscope S-3700N
          • Scanning Electron Microscope FlexSEM 1000 / FlexSEM 1000 II
        • Field Emission Scanning Electron Microscope (FESEM)
          • Ultra-high Resolution Field Emission Scanning Electron Microscope SU9000
          • Ultra-high Resolution Field Emission Scanning Electron Microscope Rugulus SU8100 / SU8200 Series
          • Ultra-High-Resolution Schottky Field Emission Scanning Electron Microscope SU7000
          • Schottky Field Emission Scanning Electron Microscope SU5000
        • Transmission Electron Microscope (TEM)
          • Field Emission Transmission Electron Microscope HF5000
          • Field Emission Transmission Electron Microscope HF-3300
          • Transmission Electron Microscope H-9500
          • Transmission Electron Microscope HT7800 Series
        • Transmission Electron Microscope (STEM)
          • Field Emission Scanning Transmission Electron Microscope HD-2700 with and without spherical aberration corrector
      • MicroCT
        • Specimen Systems
          • µCT 35
          • µCT 40
          • µCT 45
          • µCT 50 (nano CT)
          • µCT 90
          • µCT 100
          • µCT 100 HE
        • Preclinical Systems
          • vivaCT 40 - In vivo MicroCT
          • vivaCT 75 - In vivo MicroCT
          • vivaCT 80 - In vivo MicroCT
          • XtremeCT II
          • XtremeCT
        • Clinical microCT
          • XtremeCT II
      • Scanning Acoustic Microscopy
        • KSI v-Series
          • KSI v 300
          • KSI v8
          • KSI v8 Advanced
          • KSI v8 Duo
          • KSI v8 Multihead
    • Focused Ion Beam
      • Focused Ion and Electron Beam System Ethos NX5000
      • Real-time 3D analytical FIB-SEM NX9000
      • Focused Ion and Electron Beam System & Triple Beam System NX2000
      • Focused Ion Beam System MI4050
      • Mirco-sampling system
      • CAD Navigation System
        NASFA (Navigation
        system for Failure
        Analysis)
    • Atomic Force Microscopy
      • Probe Station AFM5000II / Real TuneII
      • General-purpose Small Unit AFM5100N
      • Environment Control Unit AFM5300E
      • Atomic Force Microscope AFM5500M
    • Microanalysis
      • Energy Dispersive Microanalysis System (EDS)
        • TEAM™ EDS System for SEM
        • TEAM™ EDS System for TEM
        • Genesis System
        • EDS Detectors
          • Silicon Drift Detector (SDD) for the Transmission Electron Microscope (TEM)
          • Silicon Drift Detector (SDD) for the Scanning Electron Microscope (SEM)
          • Si(Li) Detector
      • Wavelength Dispersive Microanalysis System (WDS)
        • LEXS
        • TEXS
      • Electron Backscattered Diffraction (EBSD)
        • TEAM™ EBSD Analysis System
        • OIM™ Data Analysis
        • EBSD Cameras
          • Hikari XP EBSD Camera
          • DigiView IV EBSD Camera
          • Forward Scatter Detector (FSD)
    • nano-IR Spectroscopy
      • mIRage IR microscope
      • O-PTIR
    • Surface Metrology
      • Measuring Microscopes
        • Portable Measuring Microscopes
        • Video Measuring Microscopes
        • Measuring Microscopes with eyepiece
      • Microhardness Tester VMHT
    • Surface Sciences
      • LEIS
      • VLS-80
      • SurfaceLab 7
      • SIMS
        • M6
        • M6 Plus
        • M6 Hybrid SIMS
        • TOF-SIMS 5
      • X-ray Photoelectron Spectrometer (XPS)
        • K-Alpha™+ X-ray Photoelectron Spectrometer (XPS) System
        • ESCALAB 250Xi X-ray Photoelectron Spectrometer (XPS) Microprobe
        • Theta Probe Angle-Resolved X-ray Photoelectron Spectrometer (ARXPS) System
    • Raman Spectroscopy
      • XploRA Series
        • XploRA ONE™ - Simply better Raman
        • XploRA™ PLUS
        • XploRA INV
        • XP Examina - Forensics Package
      • LabRAM HR Evolution
      • Triple Raman spectrometers
    • Sample Preparations
      • Ultramicrotomes
        • PowerTome 3D
        • PowerTome PCZ
        • PowerTome XL
        • PowerTome FL
        • LN Ultra
        • Advanced Substrate Holder
        • Automated Tape Collecting Ultramicrotome
      • Rotary Microtomes
        • MT990: Rotary Microtome
        • MT990 with CR1000: Rotary Microtome with Cryosectioning System
        • MR3: Series 300 Motorized Rotary Microtome
        • MR2: Series 200 Manual Rotary Microtome
      • Workflow Instruments
        • Automated EM Tissue Processor
        • Anti-Vibration Table
        • FS8500: Freeze Substitution System
        • GKM2: Glass Knife Maker
      • Sputter Coaters and SEM/ TEM Carbon Coaters
        • SC7620 Mini Sputter Coater/Glow Discharge System
        • Q150V Plus for ultra-fine coatings in high vacuum applications
        • Q150R Plus - Rotary Pumped Coater
        • Q150T Plus - Turbomolecular pumped coater
        • Q150 GB Turbo-Pumped Sputter Coater / Carbon Coater for Glove Box
        • Q300T T Plus - triple target sputter coater for specimens up to 200mm diameter
        • Q300T D Plus - dual target sequential sputtering for specimens up to 150 mm diameter
      • Cryo-SEM Preparation Systems
        • PP3010T Cryo-SEM/Cryo-FIB/SEM Preparation System
        • PP3006 CoolLok Cryo Transfer for SEM and FIB/SEM
        • PP3005 SEMCool Non-Airlock Cooling System for SEM and FIB/SEM
      • Critical Point Dryers
        • E3100 Critical Point Dryer
        • K850 Critical Point Dryer
        • K850WM Large Chamber Critical Point Dryer
      • Freeze Dryers for Sample Preparation
        • K750X Peltier-Cooled EM Freeze Dryer
        • K775X Liquid Nitrogen Cooled Turbo-Pumped EM Freeze Dryer
      • Bench-Top Vacuum Evaporators
        • K975X/K975S Turbo-Pumped Thermal Evaporators
      • Recirculating Heaters and Chillers
        • E4800 Recirculating Heater/Chillers
      • Coolstage - Peltier-Cooled SEM Stage
      • K1050X RF Plasma Etcher/Asher/Cleaner
      • PP3004 QuickLok Ambient Transfer System
      • GloQube Glow Discharge System for TEM Grids and Surface Modifications
      • Sputter Targets
      • Carbon Consumables
      • IM4000Plus Series Ion-Milling Systems
      • ZONE Desktop Sample Cleaner and Desiccator for SEM/TEM
  • Activities
  • About us
  • Career
  • Contact us
Atomic Force Microscopes

Atomic Force Microscope Controller - AFM5000II

Hitachi AFM5000II includes the control system and software package to allow a wealth of advanced imaging and data analysis. Its superb function RealTune enables the automatic and self-optimizing data acquisition for easier, faster, and more consistent collection of high-quality AFM images regardless of user skill level. It also provides a wide range of uncommon features such as Q control, tip calibration, and 3D overly for enhanced measurements and data processing.

The all new ARM5000II SPM controller from Hitachi offers an advanced auto-tuning function for measurement parameters with a new GUI enabling simple nano-imaging.

Features

1. RealTuneII Auto Tuning Functions for Optimal Measurement     Parameters

The improved auto tuning function systematically and efficiently monitors sample topography, scanning area, the cantilever, and the scanner to determine the best operating conditions. As the measurement parameters are optimized, the cantilever’s vibration amplitude and operation frequency are automatically adjusted based on the sample and cantilever type. The new and improved auto tuning algorithm offers reliable and precise images with a simple point-and-click!

• One-Click Automatic Measurement




• Automatic Tuning Function for Various Samples

Conventional tuning system
Delicate fibers are deformed and damaged in cross directions.

Improved algorithm
The complex fiber structure is clearly observed with no damage.




[Example 1] Fibrous carbon nano-tube structure (Gecko adhesive tape, sample generously provided by Nitto Denko Corporation)

Conventional value
Crystal steps are destroyed and unclear.

Improved algorithm
A stable observation of crystal steps by the improved tuning function.




[Example 2] Polycrystalline organic thin-film transistor (polycrystalline pentacene thin film, sample generously provided by Kitamura Laboratory, Kobe University)

2. New GUI (Graphical Use Interface)

• Intuitive and logical control icons balance the screen layout with   information provided for   ultra-efficient, productive, and easy AFM   operation for all levels of users.




• Measurement and analysis tabs provide organized and spacious work areas on the   monitor display.




3. Analysis Functions

    The 3D Overlay Function enables the observation of "cause-and-effect     relationship" between topography and physical properties. A variety of     other functions, such as roughness and cross-section analysis, are also     standard tools.




• Roughness and Cross-Section Profile Analysis



4. Desktop Design

Small form factor for flexible, efficient space usage.
(220mm(W)×500mm(D)×385mm(H),approximately 15kg)



Specifications

Compatible Units AFM5100N, AFM5300E
RealTuneII Automatic tuning of amplitude, contact force, scan speed, and feedback gains
(Various tuning modes including Auto, Fast, Soft, Rough, Flat, and Point)
Various Functions Operating instructions; Tab structure (Measurement/ Analysis); Movable scopes/ Measurement area tracking; Batch processing; and Tip calibration
Operating Voltage XY(±200V/18bit)Z(±200V/26bit)
Multi Channel(Data Points) 4 channels (max. 2,048×2,048)
2 channels (max. 4,096×4,096)
Rectangular Scan 1:1, 2:1, 4:1, 8:1, 16:1, 32:1, 64:1, 128:1, 256:1, 512:1, 1024:1
Analysis Software 3D display and overlay, Roughness, Cross-section, Average cross-section
Size 220mm(W)×500mm(D)×385mm(H)、approximately 15kg
Power Supply AC 100V~240V±10%


* Windows is a registered trademark of Microsoft Corporation in the United   States and other countries


 

Atomic Force Microscopes Controller - AFM5000II

Atomic Force Microscopes

• Probe Station AFM5000II   / Real TuneII

• General-purpose Small   Unit AFM5100N

• Environment Control   Unit AFM5300E

• Atomic Force   Microscope AFM5500M

Copyright 2012 © All Rights Reserved By HI-TECH INSTRUMENTS.