Atomic Force Microscopes

Atomic Force Microscope Controller - AFM5000II

Hitachi AFM5000II includes the control system and software package to allow a wealth of advanced imaging and data analysis. Its superb function RealTune enables the automatic and self-optimizing data acquisition for easier, faster, and more consistent collection of high-quality AFM images regardless of user skill level. It also provides a wide range of uncommon features such as Q control, tip calibration, and 3D overly for enhanced measurements and data processing.

The all new ARM5000II SPM controller from Hitachi offers an advanced auto-tuning function for measurement parameters with a new GUI enabling simple nano-imaging.

Features

1. RealTuneII Auto Tuning Functions for Optimal Measurement     Parameters

The improved auto tuning function systematically and efficiently monitors sample topography, scanning area, the cantilever, and the scanner to determine the best operating conditions. As the measurement parameters are optimized, the cantilever’s vibration amplitude and operation frequency are automatically adjusted based on the sample and cantilever type. The new and improved auto tuning algorithm offers reliable and precise images with a simple point-and-click!

• One-Click Automatic Measurement




• Automatic Tuning Function for Various Samples

Conventional tuning system
Delicate fibers are deformed and damaged in cross directions.

Improved algorithm
The complex fiber structure is clearly observed with no damage.




[Example 1] Fibrous carbon nano-tube structure (Gecko adhesive tape, sample generously provided by Nitto Denko Corporation)

Conventional value
Crystal steps are destroyed and unclear.

Improved algorithm
A stable observation of crystal steps by the improved tuning function.

[Example 2] Polycrystalline organic thin-film transistor (polycrystalline pentacene thin film, sample generously provided by Kitamura Laboratory, Kobe University)

2. New GUI (Graphical Use Interface)

• Intuitive and logical control icons balance the screen layout with   information provided for   ultra-efficient, productive, and easy AFM   operation for all levels of users.




• Measurement and analysis tabs provide organized and spacious work areas on the   monitor display.




3. Analysis Functions

    The 3D Overlay Function enables the observation of "cause-and-effect     relationship" between topography and physical properties. A variety of     other functions, such as roughness and cross-section analysis, are also     standard tools.




• Roughness and Cross-Section Profile Analysis



4. Desktop Design

Small form factor for flexible, efficient space usage.
(220mm(W)×500mm(D)×385mm(H),approximately 15kg)



Specifications

Compatible Units	AFM5100N, AFM5300E
RealTuneII	Automatic tuning of amplitude, contact force, scan speed, and feedback gains (Various tuning modes including Auto, Fast, Soft, Rough, Flat, and Point)
Various Functions	Operating instructions; Tab structure (Measurement/ Analysis); Movable scopes/ Measurement area tracking; Batch processing; and Tip calibration
Operating Voltage	XY（±200V/18bit）Z（±200V/26bit）
Multi Channel(Data Points)	4 channels (max. 2,048×2,048) 2 channels (max. 4,096×4,096)
Rectangular Scan	1:1, 2:1, 4:1, 8:1, 16:1, 32:1, 64:1, 128:1, 256:1, 512:1, 1024:1
Analysis Software	3D display and overlay, Roughness, Cross-section, Average cross-section
Size	220mm（W）×500mm（D）×385mm（H）、approximately 15kg
Power Supply	AC 100V～240V±10%

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