SIMS Microprobe for Isotopic and Trace Element Analysis at High Spatial Resolution
The CAMECA NanoSIMS 50L is a unique ion microprobe optimizing SIMS analysis performance at high lateral
resolution. It is based on a coaxial optical design of the ion gun and the Secondary ion extraction, and
on an original magnetic sector mass analyzer with multicollection.
The NanoSIMS 50L delivers simultaneously several key performances that can only be obtained
individually with any other known instrument or technique:
• High analysis spatial resolution (down to 50 nanometers),
• High sensitivity (ppm in element imaging),
• High Mass Resolution (M/dM),
• Parallel acquisition of seven masses,
• Fast acquisition (DC mode, not pulsed),
• Analysis of electrically insulating samples without problem.
• And thanks to recent improvements,
isotope ratio reproducibility of a few tenths of permil
can now be achieved.
Extended fields of applications
The NanoSIMS 50L opens new possibilities for coupling phylogenetic identity (with FISH or El-FISH)
and metabolic function (using stable isotope labeling) of single cells in studies of mixed microbial
communities from the environment. N. Musat, MPI Bremen, Germany.
Cell Biology: (see
The 50nm resolution and isotopic ratio capabilities of the NanoSIMS 50L allow
of accumulations and fluxes of several molecules labeled with different stable isotopes. C. Lechene and D.P. Corey, Harvard Medical School & Brigham Women's Hospital, USA.
Geology and Space Science: (see
The NanoSIMS 50L allows precise isotopic and elemental measurements of deep sub-micron areas,
grains or inclusions from interplanetary dust particles, meteorites, and mineral sections.
Working in multiple Faraday Cup configuration and with spot size of a few µm, it delivers isotope
ratio measurements with precision and external reproducibility down to a few tenths of permil. J. Moreau et al., SCIENCE.
Material Research: (see
Thanks to its high sensitivity at high mass resolution (no mass interference),
the NanoSIMS 50L allows trace element (dopant)
imaging & quantification with 50nm
SIMS lateral resolution, even in electrically insulating materials. H. Haneda, NIMS, Japan.
The NanoSIMS 50L was designed by Pr. Slodzian and is manufactured by CAMECA under a UPS-ONERA license.