CAMECA's new 3D Atom Probe Microscope: unmatched 3D sub-nanometer analytical performance!
CAMECA innovation has delivered its new, cutting-edge atom probe microscope offering increased detection
efficiency across a wide variety of metals, semiconductors and insulators: more than 40% extra atoms detected
per nm3 analyzed!
Thanks to its impressive new features and enhancements, the LEAP 5000 platform collects nanoscale
information from a microscale dataset in just a few hours!
• Increased detection efficiency provides unparalleled sensitivity
• Improved Field-of-View and detection uniformity - the ultimate 3D spatial resolution
• Enhanced multi-hit detection capabilities for the most accurate compositional measurements
• Faster and variable repetition rate for ultra-high speed data acquisition
• New robust & ergonomic platform for increased ease-of-use and reduced time-to-knowledge
• Live-time monitoring to ensure the highest quality data in every measurement
• Advanced laser control algorithms provide measurably improved sample yields
The LEAP 5000 delivers improved compositional accuracy, precision and detection limits,
enhanced sample throughput together with increased yield and ultimate reproducibility.