LEAP 5000
CAMECA's new 3D Atom Probe Microscope: unmatched 3D sub-nanometer analytical performance!
CAMECA innovation has delivered its new, cutting-edge atom probe microscope offering increased detection
efficiency across a wide variety of metals, semiconductors and insulators: more than 40% extra atoms detected
per nm3 analyzed!
• Increased analysis volumes & detection efficiency
• Unparalleled compositional precision & accuracy
• Greater productivity & ease-of-use
Thanks to its impressive new features and enhancements, the LEAP 5000 platform collects nanoscale
information from a microscale dataset in just a few hours!
• Increased detection efficiency provides unparalleled sensitivity
• Improved Field-of-View and detection uniformity - the ultimate 3D spatial
resolution
• Enhanced multi-hit detection capabilities for the most accurate
compositional measurements
• Faster and variable repetition rate for ultra-high speed data acquisition
• New robust & ergonomic platform for increased ease-of-use and
reduced time-to-knowledge
• Live-time monitoring to ensure the highest quality data in every
measurement
• Advanced laser control algorithms provide measurably improved sample
yields
The LEAP 5000 delivers improved compositional accuracy, precision and detection limits,
enhanced sample throughput together with increased yield and ultimate reproducibility.
LEAP Si