The flexible, high precision sample manipulators as well as the perfect charge compensation
allow the analysis of virtually all kinds of samples, making our instruments the most flexible
SIMS tools in the market.
Due to the modular design, the instruments can be configured with a selection of optimised ion guns,
sample preparation facilities and a variety of special accessories in order to address even the most
challenging analytical tasks. The computer control of all instrument functions and parameters ensures
ease-of-use and a high level of automation.
ION-TOF has a strong tradition of collaboration with its customers to incorporate new ideas for
hardware and software.
The modular design of the TOF.SIMS 5 is ideal for customisation. In particular due to the horizontal
sample concept a large variety of UHV sample preparation chambers, designed by our experts for
individual customer's specific requirements, can easily be coupled to the instrument.
These chambers can also be used to accommodate complementary analysis techniques such as XPS or AES.
It is also possible to couple the TOF.SIMS 5 to other floor standing high-end instruments