Dual-PLL MFM image of bit patterned media. Image size is 2x2µm2 |
Dual-PLL AFM image of bit
patterned media taken
simultaneously with the
MFM image. |
The example shows the analysis of a bit-patterned media sample. Out-of-plane magnetic domains and topographic features can nicely be resolved. |
Due to the Dual-PLL MFM mode, the topographic and magnetic information can be acquired in one scan simultaneously. |
Tip magnetised up |
Tip magnetised down |
Surface profile of the sputter crater shown in image 3 (The perfect companion for the TOF.SIMS 5) |
Contact AFM image measured at position A in the surface profile |