logo

 
  • Home
  • Laboratory
  • Products ▼
    • Advanced Microscopy
      • Confocal Laser Scanning Microscopy
        • Leica TCS SP8
        • Leica TCS SP8 X
        • Leica TCS SP8 STED
        • Leica TCS SP8 MP
        • Leica TCS SP8 CARS
      • Electron Microscopy
        • TableTop Microscope
          • AeroSurf 1500 Tabletop Atmospheric Scanning Electron Microscope (ASEM)
          • Tabletop Microscope TM3030Plus
          • Energy Dispersive X-Ray Spectrometers AZtecOne / AZtecOneGO
          • Energy Dispersive X-ray Spectrophotometers Quantax70
        • Variable Pressure Scanning Electron Microscope (VP-SEM)
          • Premium VP-SEM SU3500
          • Ultra Large VP-SEM S-3700N
          • Scanning Electron Microscope FlexSEM 1000
        • Field Emission Scanning Electron Microscope (FESEM)
          • Ultra-high Resolution Scanning Electron Microscope SU9000
          • Ultra-high Resolution Scanning Electron Microscope SU8200 Series
          • Ultra-high Resolution Scanning Electron Microscope SU8010 Series
          • Schottky Field Emission Scanning Electron Microscope SU5000
          • Analytical UHR Schottky Emission Scanning Electron Microscope
        • Transmission Electron Microscope (TEM)
          • 300 kV FE-TEM HF-3300
          • 300kV TEM H-9500
          • 120kV High-Contrast/High-Resolution Digital TEM HT7700
          • 120kV BF/DF STEM HT7710
        • Transmission Electron Microscope (STEM)
          • Cs-Corrected FE-STEM HD-2700
      • MicroCT
        • Specimen Systems
          • µCT 35
          • µCT 40
          • µCT 50 (nano CT)
          • µCT 80
          • µCT 100
        • Preclinical Systems
          • vivaCT 40 - In vivo MicroCT
          • vivaCT 75 - In vivo MicroCT
          • vivaCT 80 - In vivo MicroCT
          • XtremeCT
        • Clinical microCT
          • XtremeCT
      • Scanning Acoustic Microscopy
        • KSI v-Series
          • KSI v-350
          • KSI v-400
          • KSI v-700
          • KSI v-1000
          • KSI v-duo
          • KSI v-quattro
          • KSI v-octo
        • KSI i-Series
          • KSI Auto LED SAM
          • KSI i-Air
          • KSI i-Ingot
          • KSI i-Wafer
          • KSI i-XL
        • KSI nano-Series
          • KSI nano
    • Focused Ion Beam
      • Focused Ion Beam
      • nanoDUE'T FIB-SEM NB5000
      • Micro Sampling Attachment
      • CAD Navigation System NASFA (Navigation system for Failure Analysis)
      • Real-time 3D analytical FIB-SEM NX9000
      • Focused Ion Beam System MI4050
      • Hybrid FIB-SEM System NX2000
    • Scanning Probe Microscope
      • Atomic Force Microscope Controller - AFM5000II
      • Compact General-Purpose Atomic Force Microscope - AFM5100N
      • Environmental Control Atomic Force Microscopes - AFM5300E
      • Scanning Probe Microscope AFM5500M
    • Microanalysis
      • Electron Probe Micro-Analyzer (EPMA)
        • SXFive
        • SXFiveFE
        • Shielded SX
      • Energy Dispersive Microanalysis System (EDS)
        • TEAM™ EDS System for SEM
        • TEAM™ EDS System for TEM
        • Genesis System
        • EDS Detectors
          • Silicon Drift Detector (SDD) for the Transmission Electron Microscope (TEM)
          • Silicon Drift Detector (SDD) for the Scanning Electron Microscope (SEM)
          • Si(Li) Detector
      • Wavelength Dispersive Microanalysis System (WDS)
        • LEXS
        • TEXS
      • Electron Backscattered Diffraction (EBSD)
        • TEAM™ EBSD Analysis System
        • OIM™ Data Analysis
        • EBSD Cameras
          • Hikari XP EBSD Camera
          • DigiView IV EBSD Camera
          • Forward Scatter Detector (FSD)
    • Surface Metrology
      • 3D True Colour Optical Profiler
        • InfiniteFocus Standrad
        • InfiniteFocus SL
        • InfiniteFocus X-Larger
        • IF-SensorR25
        • IF-EdgeMasterX
        • IF-EdgeMaster
        • IF-Portable
        • IF-Profiler
        • Advance Real3D
        • Real 3D Rotation Unit
        • MeX
      • Stylus Profiler
        • Alpha-Step IQ Surface Profiler
        • AlphaStep® D-100 Stylus Profiler
        • AlphaStep® D-120 Stylus Profiler
        • P-7 stylus profiler
        • P-17+ stylus profiler
      • Optical Profiler
        • MicroXAM-100
        • MicroXAM-1200
      • Measuring Microscopes
        • Portable Measuring Microscopes
        • Video Measuring Microscopes
        • Measuring Microscopes with eyepiece
      • Microhardness Tester VMHT
    • Semiconductor Metrology
      • LEXES
      • Wafer Metrology
        • MT3000
        • MT3000 VIS and IR (1050-1550nm)
        • MT-100IR
        • MT50/100
      • Mask Metrology
        • MT270DUV (LWM270DUV)
        • MT250DUV (LWM250DUV)
        • MT250UV (LWM250UV)
        • MT250 (LWM250)
        • MT2030
      • Large Area Substrate Metrology
        • MT5500
    • Surface Sciences
      • LEIS
      • Sector SIMS
        • IMS 7f
        • IMS 7f Auto
        • IMS WF, SC Ultra
        • IMS 7f-GEO
        • IMS 1280-HR
        • Shielded IMS 7fR
        • NanoSIMS 50L
      • Time OF Flight SIMS
        • TOF.SIMS5
        • TOF.SIMS 300
        • TOF.SIMS 300 R
        • Customised Systems
      • Tomographic Atom Probe
        • LA-WATAP
        • LEAP HR
        • LEAP Si
        • LEAP 5000
      • Quadrapole SIMS
        • Universal Quadrapole SIMS 4550
        • FullL-water Metrology Tool For ULE SIMS 4600
      • X-ray Photoelectron Spectrometer (XPS)
        • K-Alpha™+ X-ray Photoelectron Spectrometer (XPS) System
        • ESCALAB 250Xi X-ray Photoelectron Spectrometer (XPS) Microprobe
        • Theta Probe Angle-Resolved X-ray Photoelectron Spectrometer (ARXPS) System
    • Raman Spectroscopy
      • XploRA Series
        • XploRA ONE™ - Simply better Raman
        • XploRA™ PLUS
        • XploRA INV
        • XP Examina - Forensics Package
      • LabRAM HR Evolution
      • Triple Raman spectrometers
    • Sample Preparations
      • Sputter and Carbon Coaters
        • SC7620 Mini Sputter Coater/Glow Discharge System
        • Q150R Rotary-Pumped Sputter Coater/Carbon Coater
        • Q150T Turbo-Pumped Sputter Coater/Carbon Coater
        • Q150 GB Turbo-Pumped Sputter Coater / Carbon Coater for Glove Box
        • Q300R T Triple Target, Large Chamber, Rotary-Pumped Sputter Coater
        • Q300T T Triple Target, Large Chamber, Turbo-Pumped Sputter Coater
        • Q300T D Dual Target Sequential Sputtering System
      • Cryo-SEM Preparation Systems
        • PP3010T Cryo-SEM/Cryo-FIB/SEM Preparation System
        • PP3006 CoolLok Cryo Transfer for SEM and FIB/SEM
        • PP3005 SEMCool Non-Airlock Cooling System for SEM and FIB/SEM
      • Critical Point Dryers
        • E3100 Critical Point Dryer
        • K850 Critical Point Dryer
        • K850WM Large Chamber Critical Point Dryer
      • Freeze Dryers for Sample Preparation
        • K750X Peltier-Cooled EM Freeze Dryer
        • K775X Liquid Nitrogen Cooled Turbo-Pumped EM Freeze Dryer
      • Bench-Top Vacuum Evaporators
        • K975X/K975S Turbo-Pumped Thermal Evaporators
        • Q300T ES Large Chamber Turbo-Pumped Evaporator/Sputter Coater
      • Recirculating Heaters and Chillers
        • E4800 Recirculating Heater/Chillers
        • E3500 Thermocirculator
      • Coolstage - Peltier-Cooled SEM Stage
      • K1050X RF Plasma Etcher/Asher/Cleaner
      • PP3004 QuickLok Ambient Transfer System
      • GloQube Glow Discharge System for TEM Grids and Surface Modifications
      • Sputter Targets
      • Carbon Consumables
      • IM4000Plus Series Ion-Milling Systems
      • ZONE Desktop Sample Cleaner and Desiccator for SEM/TEM
  • Activities
  • About us
  • Career
  • Contact us
Surface Sciences

K-Alpha™+ X-ray Photoelectron Spectrometer (XPS) System

Achieve research-grade results with the minimum effort. The Thermo Scientific™ K-Alpha™+ X-ray Photoelectron Spectrometer (XPS) System is a fully integrated, monochromated small-spot XPS system with depth profiling capabilities. State-of-the-art performance, reduced cost of ownership, increased ease of use and compact size make the K-Alpha X-ray XPS System ideal for a multi-user environment.

Description

Designed for Productivity, from Research to Routine

Building on the legacy of the award-winning K-Alpha XPS System, the K-Alpha+ spectrometer delivers much improved spectroscopic performance. This leap forward results in faster analysis times, improved element detection, and the possibility to acquire data at higher resolution yielding better chemical state identification.

Analytical options include the revolutionary dual mode ion source, a vacuum transfer module for moving air-sensitive samples from a glove box to the system, and the tilt module for ARXPS data collection. Equipped with the Thermo Scientific™ Avantage Data System, the complete surface analysis software system, the K-Alpha+ has a range of software features designed to optimize data interpretation, data reporting and usability. The K-Alpha+ XPS system meets the requirements of both experienced XPS analysts and newcomers to the technique, bringing together high performance, monochromated XPS and sputter depth profiling, with intelligent automation and intuitive control.

Powerful Performance

• Selectable area spectroscopy
• Sputter depth profiling
• Micro-focused monochromator
• Snapshot acquisition
• High-resolution chemical state spectroscopy
• Insulator analysis
• Quantitative chemical imaging

Unparalleled Ease of Use

• Acquisition — spectra, images, profiles, line scans
• Interpretation — elemental and chemical state identification
• Processing — Quantification, peak fitting, real-time profile display,   spectrum-image manipulation, PCA, phase analysis, TFA, NLLSF, PSF   removal, optical/XPS image overlays
• Reporting — automatic report generation with simple export to other   software packages
• Control — all hardware controlled from the Avantage software interface
• Avantage Indexer — data archive management
• Audit trail logging
• System performance logging
• Calibration on demand
• Full remote operation

Key Features

• Analyzer — 180° double focusing hemispherical analyzer with 128-  channel detector
• X-ray source — Al Ka micro-focused monochromator with variable spot   size (30-400µm in 5µm steps)
• Ion Gun — Energy range 100-4000eV
• Charge Compensation — Dual beam source
• Sample Handling — 4-axis sample stage, 60 x 60mm sample area, 20mm   maximum sample thickness
• Vacuum System — 2x 220L/s turbo molecular pumps for entry and   analysis chambers
• Options —Thermo Scientific™ MAGCIS™ Dual Beam Ion Source,   vacuum transfer module, tilt module for ARXPS, sample bias module.


             
 

K-Alpha™+ X-ray Photoelectron Spectrometer (XPS) System

X-ray Photoelectron Spectrometer

• K-Alpha™+ X-ray   Photoelectron   Spectrometer (XPS)   System

• ESCALAB 250Xi X-ray   Photoelectron   Spectrometer (XPS)   Microprobe

• Theta Probe Angle-  Resolved X-ray   Photoelectron   Spectrometer (ARXPS)   System

Copyright 2012 - 2016 © All Rights Reserved By HI-TECH INSTRUMENTS